Special 2006 | Volume 31 Issue Special | View Issue
In the Common Focus Point (CFP) approach to seismic imaging the migration process is formulated in terms of two separate steps: focusing in detection and focusing in emission. The latter means that in CFP-migration the upgoing and downgoing wave fields are separately addressed. This property of CFP-migration is most favorable in the situation of mode conversion: the operator for focusing in detection may address another wave type than the operator for focusing in emission, without making the migration algorithm more complex. In addition, operator updating replaces velocity updating (P and S) and angle-averaged reflection output can be easily extended to angle-dependent reflection output (P and S). The proposed imaging approach is illustrated on a synthetic and field data example.
Author Biography
Dr. A.J. (Guus) Berkhout – Professor Berkhout started his career with Shell in 1964, where he held several international positions in R&D and technology transfer. In 1976 he accepted a Chair at Delft University of Technology in the field of geophysical and acoustical imaging. During 1998-2001, he has been a member of the Board, being responsible for scientific research, knowledge management and intellectual property. In 2001 he also accepted a chair in the field of innovation management.
A.J. Berkhout has developed a large number of new concepts and algorithms, which are now being commercially used in the upstream oil and gas industry. He has written several hundred scientific papers, and a number of books in the fields of geophysics and innovation. In the mid-eighties he founded the Science-Industry Consortium DELPHI, which is now financed by twenty five international companies.
Professor Berkhout is a member of the Royal Netherlands Academy of Arts and Sciences (KNAW) and the Netherlands Academy of Engineering (NFTW), an honorary member of the Society of Exploration Geophysicists (SEG) and recipient of the SEG’s Maurice Ewing Award. He also serves on a number of Governing Boards in the scientific and business communities.
Dirk J. (Eric) Verschuur received his M.Sc. degree in 1986 and his Ph. D degree (honors) in 1991 from the Delft University of Technology (DUT), both in applied physics. From 1992-1997 he worked under a senior research fellowship from the Royal Dutch Academy of Art and Sciences (KNAW). In 1997 he became assistant professor and since 1999 he is an associate professor at the DUT at the laboratory of Acoustical Imaging and Sound Control. He is the project leader of the DELPHI research consortium in the area of Multiple Removal and Structural Imaging. His main interests are seismic modeling, processing and migration techniques. In 1997 he received SEG’s J. Clarence Karcher award. He is a member of SEG and EAGE.